Microanalysis with EDS2008
X-ray microanalysis is a very common analytical method for determination of the chemical composition of samples in electron microscopes. EDS2008 is a powerful, yet easy to use system encompassing all aspects of x-ray microanalysis.
Acquire and analyze X-ray Spectra, X-ray Maps, Linescans and EM images, to perform a complete analytical analysis of a sample located in a Scanning Electron Microscope (SEM) or Transmission Electron Microscope (TEM). Operating on Microsoft operating systems (Windows Vista, XP and Windows 2000), the EDS2008 software seamlessly integrates with many other applications to provide custom report generation and connectivity with other networked systems.
What seperates EDS2008 from other systems?
- all the features come standard, not as costly options
- free software updates for the life of the system
- three year part and labor warranty
| Complete New EDS Systems Buying a new SEM or TEM? Or maybe you're interested in adding an EDS / Imaging system to an existing microscope? We provide several configurations of new systems which include premium EDS Detectors and Digital Imaging. |
Upgrades for existing EDS / Imaging Systems keep your EDS detector Already have an EDS system? EDS2008 can be interfaced to your existing detector, replacing your old EDS system with a modern PC-based one. In addition it provides Digital Imaging. Detector upgrades, such as light element windows, crystal changes, etc. are also available. |